Liren Optoelectronics provides complete custom services from optical system design to mass production. Whether for system integration or single‑component customization, we can meet customers’ stringent requirements for precision, performance and delivery schedule.
| Structured‑light Projection Engine | High‑precision DLP coded‑light projection Blue‑light suppression for high‑glare interference Multi‑frequency fringe / Gray code / Random dot matrix 1920×1080 resolution Compatible with 3D AOI / 3D SPI / high‑precision 3D scanning. |
| Scheimpflug Large Depth‑of‑Field System | Scheimpflug tilted‑image principle Specialized inspection procedures Compact design Large depth‑of‑field coverage Suitable for 3D inspection imaging, inclined‑surface inspection and structured‑light measurement. |
| Telecentric Lens System | Dual‑sided telecentric parallax elimination Stable magnification Low distortion <0.2% High contrast Suitable for machine vision and precision dimension inspection. |
| Laser Illumination Lens | Multi‑wavelength support: 445nm/525nm/650nm/NIR Illumination uniformity >90% Zoom ratio 3~20× Suitable for target illumination and scene searching. |
| Auto‑zoom Lens for Target Tracking | Response time <0.02ms Full‑range zoom <3s Optical‑axis stability <3 pixels Service life >100,000 cycles Suitable for thermal‑imaging sights and thermal‑search products. |
| Auto‑zoom Lens with Stabilized Optical Axis | High‑precision focal‑length control <0.1mm High optical‑axis stability over full zoom range Long‑service‑life design Suitable for tracking systems requiring high optical‑axis consistency. |
Commercial off‑the‑shelf optical systems, lenses and objectives often fail to satisfy OEM instrument manufacturers and research teams with innovative requirements for special applications. When standard products become bottlenecks, customization is the starting point for breakthroughs.
Independent control of core optics to avoid supply‑chain disruption and technical dependency risks.
Performance UpgradeApplication‑specific targeted optimization delivering performance superior to generic products of the same class.
Precisely‑matched SpecificationsFocal length, NA, working distance, wavelength, interface and other parameters precisely match requirements without compromise.
Strengthen Competitive MoatDifferentiated optical solutions build technical barriers and improve product market competitiveness and commercial returns.
Manufacturing ConsistencyStable batch‑to‑batch performance ensuring high consistency between mass‑produced units and sample specifications.
On‑time DeliveryAgile R&D and flexible production lines guarantee delivery schedules and fast response to market windows.
Full‑lifecycle After‑sales SupportComplete optical‑design documents provided for customer‑side system‑level simulation and secondary integration.
Liren Optoelectronics’ optical engineers have over 20 years of experience in precision optics. We deliver full‑scope design solutions ranging from complex high‑resolution diffraction‑limited systems to moderate‑resolution single‑wavelength systems. Our scope covers optical design, mechanical structure, illumination light path, tolerance analysis and stray‑light control. System optimization is performed via Zemax / Code V to achieve high consistency between optical performance and mechanical manufacturability.
Equipped with CNC optical grinding machines, precision polishing equipment, PVD/IBS ion‑beam coating machines and clean assembly workshops. We produce high‑precision optical components with surface figure error better than λ/10 and surface roughness Ra < 0.5nm.
Complete test‑data reports are supplied with every delivered product.
| Inspection Item | Equipment / Method |
| Wavefront Error / Surface Figure | Interferometer (λ/20 accuracy) |
| Decentration / Concentricity | Dual‑beam centering instrument, optical centering lathe |
| Resolution / MTF | MTF test bench (full‑field modulation‑transfer‑function testing) |
| Transmittance / Reflectance | Spectrophotometer (200~2500nm broad‑band) |
| Geometric Dimensions | CMM coordinate‑measuring machine (sub‑micron level) |
| High‑order Aberrations | Point‑diffraction interferometer (PDI, wavefront measurement) |
| Environmental Performance | Constant‑temperature‑humidity test chamber (±0.5° C / ±2%RH) |
